Instrumentation / Techniques

• XPS for surface chemistry
• AES/SAM for identifying surface contaminants, analysing thin surface layers and mapping elemental composition at very small areas
• SEM / SEM-FIB for investigating coatings, interfaces, defects and failures by cutting into targeted areas and imaging the material structure beneath the surface
• SEM EDX for elemental composition, contamination analysis and material comparison
• RAMAN for molecular structure, material identification and carbon-based materials analysis
• TOF-SIMS or detecting trace surface contamination, mapping chemical species and understanding coatings, residues and material interfaces at very high surface sensitivity

Best for

• Coating failure
• Oxidation
• Thin-film characterisation
• Polymer surface modification
• Surface contamination
• Medical device surfaces
• Semiconductor and electronics materials
• Adhesion or delamination issues