Overview

Transmission Electron Microscopy
This analytical method allows one to have a direct look on nanostructures  and probe its morphology, sizes, crystallographical structure and chemical composition with high spatial resolution.

Sample Requirements
Typical samples, suitable for this methods are nanopowders suspensions of nanoparticles, or thin lamellae of metals or semiconductors Samples are expected to be thin 300 nm) and transparent for electrons Samples have to be stable to vacuum and electron radiation

Available techniques
Currently, we are providing users with the following methods:
– High Resolution TEM
– Bright Field and Dark Field TEM
– Selected Area Electron Diffraction (SAED)
Scanning Transmission Electron Microscopy (STEM) mode with different
detectors available:
– High Angle Annular Dark Field (HAADF STEM)
– Bright Field (BF STEM)
– Secondary Electrons (SE STEM)
– Local chemical composition analysis (STEM EDX)