Electron MicroscopySEM - Carryscope
High resolution performance imaging of conventional electron microscopes, making it easy to observe high and low magnifications of fine surface structures and digitally record images.
Unmatched Expertise
Highest Quality Results
Latest Techniques
Dedicated Scientist
Result Interpretation
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Overview
Standard features include 8 X to 300 000 X imaging and up to 5 0 nm resolution. The CarryScope produces a sharp image that makes it possible to conduct and annotate high precision measurements on sub micron structures.