TEMNanoMill®
TEM specimen preparation system
Unmatched Expertise
Highest Quality Results
Latest Techniques
Dedicated Scientist
Result Interpretation
Bespoke Quotation
Main Features
- Ultra low energy ion source
- Concentrated ion beam
- Removes amorphous and implanted layers
- Ideal for post focused ion beam processing and milling of conventionally prepared specimens
- Liquid nitrogen cooled specimen stage
Main Applications
- TEM Specimen preparation