(+353) 61 237759
University of Limerick, Bernal Institute, Limerick, V94 T9PX
Semiconductors & Electronics
Advanced materials and surface analysis for semiconductor and electronics innovation
Attlas supports semiconductor, electronics and advanced technology companies with specialist materials characterisation, surface analysis, contamination investigation and research project development through the Bernal Institute, University of Limerick.
We help companies understand the material, surface, interface, coating, thin-film, contaminant or failure issue behind a technical challenge. Through access to advanced analytical instrumentation, dedicated instrument scientists and academic expertise, Attlas provides a clear route from technical question to analytical insight.
Supporting advanced technology and electronics-enabled industries
Semiconductor and electronics companies operate in environments where material performance, surface condition, contamination control, interface behaviour and process consistency are critical.
Attlas can support companies working across:
- semiconductor materials;
- thin films and coatings;
- electronic components;
- sensors and sensing systems;
- connected health technologies;
- medical electronics;
- advanced manufacturing;
- photonics and optoelectronics;
- energy devices;
- microelectronic materials;
- surface-modified materials;
- advanced packaging and component interfaces.
Our role is to provide specialist analytical insight where companies need to understand what is happening at the surface, within a material, at an interface or across a process change.
Understanding surfaces, interfaces and materials
Many semiconductor and electronics challenges are surface or interface driven. A small change in chemistry, contamination, oxidation, morphology or layer structure can affect device performance, reliability or manufacturability.
Attlas helps companies answer questions such as:
- What is present on the surface of this material or component?
- Is there trace contamination or residue present?
- Has oxidation or surface chemistry changed after processing?
- What is the composition of a thin film, coating or interface?
- Are there defects, inclusions or particles affecting performance?
- How do two suppliers, materials or process routes compare?
- What is the structure or phase of this material?
- Can a cross-section reveal layer thickness, defects or interface quality?
- What analytical pathway should we use to understand the issue?
- Could this technical challenge become a research or development project?
Thin films, coatings and interfaces
Investigating layer structure, composition, defects and interface behaviour in thin-film and coated systems.
Relevant to:
- deposited films;
- multilayer materials;
- coating adhesion;
- interfacial defects;
- device packaging;
- sensor platforms;
- electronic materials;
- component cross-sections.
Materials development and comparison
Providing analytical insight during research, product development, prototype comparison and supplier or process evaluation.
Relevant to:
- new materials;
- coatings and surface treatments;
- electronic substrates;
- conductive and insulating materials;
- nanomaterials;
- advanced packaging materials;
- process route comparison;
- prototype development.
Reducing complexity for industry partners
University engagement can sometimes feel complex for industry. Attlas is designed to make that process easier.
We use established templates and engagement pathways to help fast-track legal, project and finance setup. This reduces administrative burden, shortens timelines and gives companies a clearer route into Bernal Institute expertise.
Attlas can also guide companies through suitable funding routes and collaborative research opportunities, helping shape projects that deliver practical industry value while supporting academic outputs such as PhD training, publications and research impact.
Relevant analytical capabilities
Attlas can help identify the most appropriate technique or combination of techniques based on the sample, material, process and technical question.
Relevant techniques for semiconductor and electronics companies may include:
- XPS for surface chemistry, oxidation, coatings, thin films and contamination analysis;
- AES / SAM for surface elemental analysis, localised contamination detection and micron-scale chemical mapping;
- ToF-SIMS for ultra-sensitive surface chemical analysis, molecular fragment identification and depth profiling of thin surface layers;
- SEM/EDX for morphology, surface features, particles, defects and elemental composition;
- SEM-FIB for precise cross-sectioning, layer analysis, interface investigation and nanoscale imaging beneath the surface;
- TEM/STEM for high-resolution nanoscale imaging, particle analysis, crystal defects and advanced material investigation;
- AFM for surface roughness, topography, morphology and nanoscale surface measurement;
- Raman for non-destructive molecular fingerprinting, phase identification and material mapping;
- XRD for crystalline phases, structural changes and material comparison;
- Single Crystal XRD for detailed structural confirmation of crystalline compounds and materials;
- Nanoindentation for hardness, stiffness, coating performance and local mechanical properties;
- FTIR for organic residues, polymer materials and contamination screening;
- DSC/TGA for polymer, thermal and material behaviour where relevant.
Where a single method does not provide the full answer, Attlas can combine techniques to build a clearer understanding of surface chemistry, composition, morphology, structure and performance.
Surface chemistry and oxidation
Understanding the chemical composition and condition of material surfaces, including oxidation, passivation, process-related changes and surface modification.
Relevant to:
- semiconductor materials;
- metal and oxide surfaces;
- thin films;
- sensor surfaces;
- electronic components;
- contact materials;
- advanced coatings;
- surface-modified substrates.
Contamination and residue investigation
Identifying unknown residues, particulates, stains, deposits or localised contaminants that may affect manufacturing, performance or reliability.
Relevant to:
- process contamination;
- handling residues;
- cleaning validation support;
- particle analysis;
- organic or inorganic residues;
- surface deposits;
- unexplained defects;
- supplier or process change investigations.
Defect and failure investigation
Supporting companies where a material, component or process is not performing as expected.
Relevant to:
- device or component failure;
- cracks, voids or inclusions;
- delamination;
- localised defects;
- surface damage;
- process-induced change;
- abnormal electrical or material behaviour;
- production troubleshooting.
From analytical insight to research partnership
Some semiconductor and electronics questions can be answered through focused sample analysis. Others may require a wider investigation involving academic expertise, method development, modelling, PhD researchers, postdoctoral researchers or funded collaborative research.
Attlas helps companies identify the right route.
This may include:
- one-off sample analysis;
- multi-technique surface or materials investigation;
- technical consultancy;
- bespoke training;
- prototype or process comparison;
- funded collaborative research;
- PhD or postdoctoral research projects;
- strategic analytical support packages;
- longer-term industry-academic partnerships.
© 2021 Attlas. All rights reserved
Created by rayobrientech@gmail.com