Instrumentation / Techniques

• SEM for morphology and elemental composition
• FIB-SEM for grain structure, layer composition, morphology and elemental composition
• TEM for nanoscale insight into particles, coatings, interfaces and internal material structure
• STEM for advanced nanoscale imaging and elemental mapping of complex materials
• EDX for rapid elemental identification of materials, particles, residues and contaminants
• AFM for measuring surface roughness, texture and nanoscale material features
• Confocal microscopy for non-destructive 3D imaging of surfaces, structures and biological samples
• TEM for high-resolution imaging of internal structure, nanoscale features and material defects

Best for

• Microstructure analysis
• Defect investigation
• Particle morphology
• Cross-section analysis
• Coating thickness
• Fracture surface analysis
• Material comparison
• Nanostructure characterisation