Overview

TOF-SIMS is a very sensitive surface analytical technique It provides detailed elemental and molecular information about surfaces, thin layers, interfaces, and full three dimensional analysis of the samples ToF SIMS technique is used in different areas including semiconductors, polymers, paint, coatings, glass ceramic, metals biomaterials, and pharmaceuticals The TOF SIMS 5 is the high end TOF SIMS instrument developed over the last 20 years Its design guarantees optimum performance in all fields of SIMS applications

Unique features of the TOF.SIMS 5 are:
• Ultra high sensitivity for molecular species by optimised cluster ion sources
• Outstanding performance for low energy depth profiling
• Sophisticated software for ease of operation and data handling
• Modular construction for configuration and upgrade flexibility
• Ergonomic design with compact footprint

Main Applications
• Detailed Elemental & Molecular
• Thin Layers
• Interfaces
• Polymer, Paints, Coatings, Glass, Ceramic, Metals
• Bio-Materials & Pharmaceuticals